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YTEC. DETECTION OF FAULTS IN A PROCESSES, EQUIPMENT, SENSORS

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DEVICE AND METHOD FOR DETECTION AND/OR DIAGNOSIS OF FAULTS IN A PROCESSES, EQUIPMENT AND SENSORS rnDevice and method for the detection and/or diagnosis of faults in a process, equipment and sensors used to measure and control variables of a process, either for single faults or multiple faults. The detection and/or diagnosis are performed on the basis of residual calculation between measured values and values calculated by a plurality of parallel linear models, built up from the existing correlations between the measured variables by the process sensors and by different equations that rule the process, such as mass and heat balances, quality relationships, etc. A fault in a model (i.e. the obtainment of a residual anomaly high by comparing the model estimation and the measurement), increases the probability that some of the parameters or faults associated to that model are failing. When all models in which a participating parameter fail or show a high probability of failure, the anomaly rate of said parameters is maximum. Using said rates and a description of cause-consequence relationship between the parameters a fault probability is obtained, where the root cause of the problem is indicated, indicating the consequences produced in the process. The device comprises data storage means; pre-processing means for filtering data; means for generation and storage of multiple behavior models; residual calculation means for calculating the difference between the measured and the predicted values of the variables; analysis means for determining the need to communicate an anomalous situation; communication means for presenting a process status report.

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Available for Sale and for Non-Exclusive Licensing. We are open to negotiate.

It is a granted Patent in US and AR, since 2018.

Key Advantages:

1. Accurate Fault Detection:
• Residual Calculation: Uses residuals between measured and predicted values to identify faults precisely.
• Multiple Models: Employs parallel linear models for comprehensive analysis.

2. Comprehensive Diagnosis:
• Root Cause Identification: Pinpoints the exact cause of faults and their consequences.
• Single and Multiple Faults: Detects both single and multiple faults effectively.

3. User-Friendly:
• Data Storage: Efficiently stores and processes data.
• Pre-Processing: Filters data for accurate analysis.
• Communication: Provides clear status reports on process conditions.

4. Cost-Effective:
• Operational Efficiency: Enhances productivity by preventing downtime.
• Risk Minimization: Reduces risks associated with faulty equipment and processes.

Why Choose Our Fault Detection Device?
• Enhanced Accuracy: Detect faults with precision and reliability.
• Comprehensive Analysis: Understand the root cause and consequences of faults.
• Operational Efficiency: Improve productivity and reduce downtime.
• Cost-Effective: Minimize risks and operational costs.

Invest in our fault detection and diagnosis device today and experience the difference in your operations!

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Patent publications:

US 10018979

AR 092747

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Seller:

ytec (Argentina)

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